| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 6 | |
| #2 | Singapore | 3 | |
| #3 | Taiwan | 3 | |
| #4 | WIPO (World Intellectual Property Organization) | 3 | |
| #5 | Australia | 2 | |
| #6 | Republic of Korea | 2 | |
| #7 | Hong Kong | 1 | |
| #8 | Malaysia | 1 | |
| #9 | Philippines | 1 |
| # | Industry | |
|---|---|---|
| #1 | Computer technology | |
| #2 | Audio-visual technology | |
| #3 | Measurement | |
| #4 | Semiconductors |
| # | Name | Total Patents |
|---|---|---|
| #1 | Amanullah Ajharali | 11 |
| #2 | Lin Jing | 7 |
| #3 | Ng Lian Seng | 6 |
| #4 | Lai Tim Hing | 6 |
| #5 | Tan Soon Guan | 5 |
| #6 | Tan Huek Choy | 4 |
| #7 | Lai Hing Tim | 4 |
| #8 | Ge Han Cheng | 4 |
| #9 | Noor Ashedah Binti Jusoh | 3 |
| #10 | Sreenivas Rao | 3 |
| Publication | Filing date | Title |
|---|---|---|
| US2009073426A1 | Multiple surface inspection system and method | |
| US2008246958A1 | Multiple surface inspection system and method | |
| WO02099403A1 | System and method for multiple image analysis | |
| US6567161B1 | Three dimensional lead inspection system | |
| US6958768B1 | CMOS inspection apparatus |