ANTON PAAR TRITEC SA has a total of 25 patent applications. It decreased the IP activity by 80.0%. Its first patent ever was published in 2007. It filed its patents most often in EPO (European Patent Office), WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets measurement, chemical engineering and optics are UNISOKU CO LTD, HYSITRON INC and ANTON PAAR GMBH.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 11 | |
#2 | WIPO (World Intellectual Property Organization) | 7 | |
#3 | United States | 3 | |
#4 | Republic of Korea | 2 | |
#5 | Switzerland | 1 | |
#6 | Japan | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Chemical engineering | |
#3 | Optics |
# | Name | Total Patents |
---|---|---|
#1 | Bellaton Bertrand | 23 |
#2 | Conte Marcello | 10 |
#3 | Woirgard Jacques | 8 |
#4 | Consiglio Richard | 7 |
#5 | Coudert Pierre-Jean | 6 |
#6 | Favaro Gregory | 5 |
#7 | Randall Nicholas | 5 |
#8 | Jacques Woirgard | 2 |
#9 | Richard Consiglio | 2 |
#10 | Bertrand Bellaton | 2 |
Publication | Filing date | Title |
---|---|---|
WO2019149931A1 | Measuring head for a material testing device | |
EP3629071A1 | Microscopy system | |
EP3405769A1 | Sample holder arrangement | |
EP3267177A1 | Method for automated surface evaluation | |
EP3267176A1 | Methods for surface evaluation | |
EP3171153A1 | Method of measuring a topographic profile of a surface of a sample and/or a topographic image | |
CH711792A2 | Method for measuring a topographic profile and / or a topographic image of a surface of a sample. | |
EP3015867A1 | Surface measurement probe | |
EP3015845A1 | Heating arrangement for a material testing device | |
WO2014202551A1 | Measuring head for nanoindentation instrument and measuring method | |
EP2065695A1 | Method for analysing a scratching test |