Learn more

ANRITSU CORP

Overview
  • Total Patents
    5,905
  • GoodIP Patent Rank
    2,477
  • Filing trend
    ⇩ 14.0%
About

ANRITSU CORP has a total of 5,905 patent applications. It decreased the IP activity by 14.0%. Its first patent ever was published in 1975. It filed its patents most often in Japan, United States and EPO (European Patent Office). Its main competitors in its focus markets measurement, telecommunications and digital networks are ROHDE & SCHWARZ, COMM RES LAB and KEYSIGHT TECHNOLOGIES INC.

Patent filings per year

Chart showing ANRITSU CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Nanami Masaya 185
#2 Sato Yuji 148
#3 Kono Kenji 143
#4 Tanimoto Takao 142
#5 Otani Akihito 140
#6 Igarashi Nobuhiro 112
#7 Nakahira Toru 106
#8 Tsukasa Fumisuke 105
#9 Uchida Yasuji 82
#10 Mori Hiroshi 81

Latest patents

Publication Filing date Title
US2021099238A1 Mobile terminal test system
US2021055337A1 Temperature test apparatus and temperature test method
US2021044994A1 Measurement device, communication terminal measurement system, and measurement-related information display method
US2021037402A1 Measurement apparatus and measurement target display method thereof
US2021099900A1 Communication terminal measurement apparatus and measurement-related information display method
US2021006460A1 Measurement apparatus and measurement method
JP2021005780A Signal processing device and synchronization signal detection method thereof
JP2021005781A Signal measuring device and clock synchronization method thereof
JP2020205537A Exclusive OR circuit
JP2020195085A Signal test device and self-test method thereof
JP2020195043A Radio wave propagation measuring device and beamforming measurement result display method thereof
JP2020193848A Phase characteristic calibration device and phase characteristic calibration method
JP2020190514A Article inspection device and article inspection method
JP2020191596A High-frequency switch, signal generator, and spectrum analyzer
JP2020191544A Transmission line circuit and wireless measuring device
JP2020187087A Optical pulse testing device
JP2020183917A Article inspection device and article inspection method
JP2020173605A Clock distribution circuit and clock distribution method, and error rate measuring device and error rate measuring method
JP2020161944A Error measuring instrument, and method for measuring response time using the same
JP2019118144A Feedback amplification circuit