AKIYAMA NOBUYUKI has a total of 13 patent applications. Its first patent ever was published in 1973. It filed its patents most often in Japan, Republic of Korea and United States. Its main competitors in its focus markets environmental technology, surface technology and coating and semiconductors are SIERRA SOLAR POWER INC, CHANGZHOU SHICHUANG ENERGY TECH CO LTD and TONGWEI SOLAR ENERGY ANHUI CO LTD.
# | Country | Total Patents | |
---|---|---|---|
#1 | Japan | 5 | |
#2 | Republic of Korea | 2 | |
#3 | United States | 2 | |
#4 | China | 1 | |
#5 | EPO (European Patent Office) | 1 | |
#6 | Taiwan | 1 | |
#7 | WIPO (World Intellectual Property Organization) | 1 |
# | Industry | |
---|---|---|
#1 | Environmental technology | |
#2 | Surface technology and coating | |
#3 | Semiconductors | |
#4 | Machines |
# | Name | Total Patents |
---|---|---|
#1 | Akiyama Nobuyuki | 13 |
#2 | Shigeno Takashi | 1 |
#3 | Fujimoto Eisuke | 1 |
#4 | Murakami Yoshinori | 1 |
#5 | Miura Shunji | 1 |
#6 | Chisaka Haruo | 1 |
Publication | Filing date | Title |
---|---|---|
JP2014067869A | Manufacturing method of hetero-epitaxial single crystal, manufacturing method of heterojunction solar cell, hetero-epitaxial single crystal, and heterojunction solar cell | |
JP2012054364A | Manufacturing method of silicon thin film, manufacturing method of silicon thin film solar cell, silicon thin film, silicon thin film solar cell | |
JPH10239244A | Method and device for detecting crack on ceramic substrate | |
JPH0843032A | Optical length measuring apparatus | |
JPH04109803A | Carrier | |
US3864174A | Method for manufacturing semiconductor device |