Learn more

ADVANCED TESTING TECHNOLOGIES INC

Overview
  • Total Patents
    21
  • GoodIP Patent Rank
    196,896
About

ADVANCED TESTING TECHNOLOGIES INC has a total of 21 patent applications. Its first patent ever was published in 2006. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets audio-visual technology, computer technology and measurement are RASTEROPS CORP, TTE INDIANAPOLIS and RENEI KAGI KOFUN YUGENKOSHI.

Patent filings in countries

World map showing ADVANCED TESTING TECHNOLOGIES INCs patent filings in countries

Patent filings per year

Chart showing ADVANCED TESTING TECHNOLOGIES INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Levi Eli 13
#2 Biagiotti William 10
#3 Britch Peter F 7
#4 Spinner Robert 6
#5 Engel Richard 5
#6 Leippe William Harold 4
#7 Howell David 4
#8 Minassian Shahen 3
#9 Leddy Thomas 2
#10 Howell David R 2

Latest patents

Publication Filing date Title
US9295169B1 Common chassis for instrumentation
US9231354B1 Interconnections for axial cables
US9007259B1 Flight line noise tester
US8817110B1 Instrument card for video applications
US8996742B1 Method for automatically testing video display/monitors using embedded data structure information
US8817109B1 Techniques for capturing and generating a DVI signal
US8782558B1 Method, program and arrangement for highlighting failing elements of a visual image
USRE45960E Single instrument/card for video applications
US8655617B1 Method and system for validating video waveforms and other electrical signals
US9291677B1 Test system and method for testing electromechanical components
US8643725B1 Method and system for validating video apparatus in an active environment
US8648869B1 Automatic test instrument for video generation and capture combined with real-time image redisplay methods
WO2012118877A1 Re-configurable electrical connectors
US8356282B1 Integrated development environment for the development of electronic signal testing strategies
WO2011088278A2 Low phase noise rf signal generating system and method for calibrating phase noise measurement systems using same
US8359504B1 Digital functional test system
US8359585B1 Instrumentation ATS/TPS mitigation utilizing I/O data stream
US2007064110A1 Single instrument/card for video applications