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ADVANCED TECH INC

Overview
  • Total Patents
    92
  • GoodIP Patent Rank
    29,811
  • Filing trend
    ⇩ 26.0%
About

ADVANCED TECH INC has a total of 92 patent applications. It decreased the IP activity by 26.0%. Its first patent ever was published in 1981. It filed its patents most often in Republic of Korea, United States and EPO (European Patent Office). Its main competitors in its focus markets measurement, machine tools and surface technology and coating are XU CHICHENG, SIGLER DAVID R and EISSMANN AUTOMOTIVE DEUTSCHLAND GMBH.

Patent filings per year

Chart showing ADVANCED TECH INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 An Doo Baeck 39
#2 Choi Byoung Chan 19
#3 Yoon Doo Hyun 15
#4 Hirai Kinji 14
#5 Choi Yong Cheol 11
#6 Akiyama Isamu 10
#7 Muto Yuka 9
#8 Takahashi Tsukasa 9
#9 Sugaya Takutaka 9
#10 Song Young Hun 9

Latest patents

Publication Filing date Title
KR102212398B1 Automated Cell Culture System
KR20190122530A Imaging apparatus and laser manufacturing apparatus comprising the same
KR20190122529A Work point tracking apparatus and laser manufacturing apparatus comprising the same
KR20190122527A Laser manufacturing apparatus and processing method
KR20190122528A Laser generator and laser manufacturing apparatus including the same
KR20200033684A Objective lens
KR101924761B1 Plasma Wound Treatment System
KR20200016093A Laser manufacturing apparatus
CN110997314A Composite material of metal and resin
KR101873580B1 System for producing cellular therapeutic agents
US2018169789A1 Laser processing apparatus
KR101888017B1 Laser patterning apparatus for 3-dimensional object and method
KR20190050188A Intraocular including substabce inducing cell and manufacturing the same
KR20190050187A Apparatus and method for prevent of posterior capsular opacification
KR101845750B1 Laser processing apparatus and laser processing method
US2019184682A1 Copper Alloy Article Containing Polyester-Based Resin and Method for Producing the Same
KR101917768B1 Heterojunction body
KR101871656B1 Method for measuring transparent thickness of a sample
KR101780498B1 A method for detecting wheel mark defect with using pattern periodic property of wafer back side
KR20180113830A Optical element inspection apparatus