| # | Country | Total Patents | |
|---|---|---|---|
| #1 | WIPO (World Intellectual Property Organization) | 4 | |
| #2 | Taiwan | 3 | |
| #3 | China | 2 | |
| #4 | United States | 2 | |
| #5 | EPO (European Patent Office) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology | |
| #3 | Basic communication technologies | |
| #4 | Electrical machinery and energy |
| # | Technology | |
|---|---|---|
| #1 | Electric digital data processing | |
| #2 | Special measuring | |
| #3 | Measuring electric variables | |
| #4 | Pulse technique | |
| #5 | Electric switches | |
| #6 | Measuring volume |
| # | Name | Total Patents |
|---|---|---|
| #1 | Lee Sang-Chuel | 5 |
| #2 | Yang Min-Sung | 2 |
| #3 | Sang-Chuel Lee | 2 |
| #4 | Lee Eok Won | 1 |
| #5 | Jae Hong Joo | 1 |
| #6 | Lee Sang Chuel | 1 |
| #7 | Cheong Sang Bo | 1 |
| #8 | Kim Chong-Hyeon | 1 |
| #9 | You-Hee Seo | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TW200935290A | Resistive touch screen which can identify multi-touch | |
| TW200915165A | Resistive touch screen which can identify multi-touch | |
| US2006055417A1 | Method and IC for detecting capacitance variation |