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ABBERIOR INSTRUMENTS GMBH

Overview
  • Total Patents
    53
  • GoodIP Patent Rank
    27,778
  • Filing trend
    ⇧ 11.0%
About

ABBERIOR INSTRUMENTS GMBH has a total of 53 patent applications. It increased the IP activity by 11.0%. Its first patent ever was published in 2014. It filed its patents most often in Germany, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets optics, measurement and audio-visual technology are REICHERT FA C, SPECTRAL APPLIED RES INC and HIROX CO LTD.

Patent filings per year

Chart showing ABBERIOR INSTRUMENTS GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Reuss Matthias 29
#2 Kastrup Lars 23
#3 Fischer Joachim 19
#4 Harke Benjamin 18
#5 Donnert Gerald 15
#6 Henrich Matthias 13
#7 Schönle Andreas 12
#8 Wurm Christian 8
#9 Heine Jörn 7
#10 Schoenle Andreas 5

Latest patents

Publication Filing date Title
DE102019008304B3 Fluorescence microscope with stabilized adjustment and use of an assembly to upgrade a fluorescence microscope
DE102019007066A1 Method and device for correcting aberrations in fluorescence microscopy
DE102019116626A1 Methods and devices for checking the confocality of a scanning and descanning microscope assembly
DE102019113975A1 Method and apparatus for monitoring the focus state of a microscope
DE102019108815A1 Processing of data sets from a confocal laser scanning microscope
DE102019108814A1 Method for operating a confocal laser scanning microscope
DE102019108696B3 Method for detecting displacements of a sample in relation to an objective
LU101084B1 Method and device for spot-illuminating a sample in a microscope
DE102018132875A1 Fluorescence light microscopy with increased axial resolution
US2019056327A1 Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers
DE102018126232B3 Scanning light microscope with different inputs for light of different wavelengths for scanning a sample
DE102018124714B3 Bandpass filter for variable lower and upper cut-off wavelength light
WO2018138087A1 Device for upgrading a light microscope comprising a camera connection to a sted microspcope
DE102017129096A1 Method for the spectral splitting of a light beam and fluorescent light microscope for carrying out such a method
DE102017122413A1 Device for selectively shaping phase fronts of a light beam and their use
DE102017102604A1 Method for controlling a laser scanning microscope when scanning a sample and laser scanning microscope
EP3312656A1 Device for relocating a light beam impacting an optical axis
JP2017075947A Scanner head and device with scanner head
EP3290983A1 Method for adjusting a laser scanning fluorescence microscope and laser scanning fluorescence microscope with an automatic adjusting device
DE102016104651A1 Method and scanning fluorescent microscope for the three-dimensional high-resolution imaging of a fluorophore-labeled structure of a sample